Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
This article delves into the use of automatic-test-pattern-generation (ATPG) tools in scan technology and the use of built-in self-test (BIST) methods when testing SoC memory arrays. Also discussed is ...
SAN JOSE, Calif. — Mentor Graphics Corp. has added new automated functionality to its FastScan automatic test pattern generation tool (ATPG) and its TestKompress embedded deterministic test tool.
SANTA CLARA, Calif. — Advantest Corp. announced it was collaborating with Synopsys Inc. to develop a fast, accurate failure-diagnostics system for deep-submicron system-on-chip (SoC) designs. The ...
The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.
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