A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips. Researchers at Cornell University have achieved something chipmakers have ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

For almost two decades, scientists have been trying to move beyond silicon, the material ...

Advances in materials and architecture could lead to silicon-free chip manufacturing thanks to a new type of transistor.