Boundary scan test system firm Goepel Electronic has introduced Module/DIMM244so as an I/O module of the CION product family. The module is serially controlled via TAP by special CION Asic chips, and ...

In the modern era, where meeting high performance and low power targets for any complex SoC (System on Chip) is very tough, testing the SoC has become even more challenging. The purpose of several DFT ...

Part I of this article discusses the design-for-test (DFT) challenges of AI designs and strategies to address them at the die level. This part focuses on the test requirements of AI chips that ...