AXI is an effective technology for finding manufacturing defects in electronics assembly operations. Manufacturers of advanced electronics products know that simultaneously producing a ...

New US regulations, CFR Part 195 Section 195.452, require that special integrity assessments be made to address potential seam-defect problems in low-frequency, electric-resistance-welded (ERW) pipe ...

Modeling the corrosivity of liquids transported over the life of a pipeline can determine the current condition of pipelines in which in-line inspection is not possible. Such modeling also allows ...

Flexxbotics, delivering workcell digitalization for robot-driven manufacturing, today announced advanced robotic machine tending compatible for in-line inspection connectivity for the complete line of ...

Led by Assistant Professor Kou Li, a research group in Chuo University, Japan, has developed a synergetic strategy among non-destructive terahertz (THz)–infrared (IR) photo-monitoring techniques and ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.