There are some imperfections, but for the most part these bubbles intersect at three-way junctions with angles close to 120 degrees. This “preference” is dictated by the interplay between the material ...

Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...

Pattern matching (PM) was first introduced as the semiconductor industry began to shift from simple one-dimensional rule checks to the two-dimensional checks required by sub-resolution lithography.

Thirteen new designs have been commissioned for the New South Wales Housing Pattern Book, though some architects believe the ...