The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...

ZEISS Crossbeam 750 ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution “see while you mill” capability, providing ...

Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...

SEM, a next-generation system designed to improve precision and efficiency in sample preparation for advanced microscopy ...

Despite advancements, cryo-EM sample preparation remains a bottleneck, affecting structural biology and protein science through intrinsic disorder challenges.

In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...

The Helmholtz Center for Materials and Energy in Berlin, Germany (HZB, originally known as Hahn-Meitner Institute, HMI) has developed a novel technique for the cross-sectional sample preparation for ...

Zeiss has unveiled the new Zeiss Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM), optimised for ...

Sample preparation plays a crucial role in bioanalytical analysis involving chromatography. Insufficient sample preparation, such as skipping protein precipitation, phospholipid removal (PLR), ...

Mass spectrometry has become a cornerstone technology for studying protein expression, interactions, and post-translational modifications (PTMs) across biological systems. Advances in instrumentation ...