As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...
In recent years, boundary scan has transformed itself. JTAG started more than a decade ago as a simple structural interconnect test technology. It now is a foundational embedded infrastructure capable ...
Richardson, Texas—A product called DFT Analyzer from ASSET InterTech, Inc., a maker of IEEE-1149.1/JTAG boundary-scan test and ISP (in-system programming) tools, promises to reduce manufacturing and ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
Bus-based packetized scan data decouples test delivery and core-level DFT requirements so core-level compression configuration can be defined completely independently of chip I/O limitations. Grouping ...
Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
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