Chipmakers are relying on machine learning for electroplating and wafer cleaning at leading-edge process nodes, augmenting traditional fault detection/classification and statistical process control in ...

Residual-based control charts are popular methods for statistical process control of autocorrelated processes. To implement these methods, a time series model of the process is required. The model ...

Randomness is inherent in all processes including manufacturing. The fundamental concepts taught in this course will help learners develop powerful statistical process control methods that are the ...

SPC Overview offers a thorough introduction to the purpose and main concepts of statistical process control (SPC). This class describes different types of control charts, such as X bar, R, and P ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...

Ensuring the quality and performance of human immunodeficiency virus, type 1 (HIV-1) enzyme-linked immunosorbent assay (ELISA) testing in routine laboratory situations is an important practical ...