Test compression has quickly moved from a luxury item for leading edge companies to a necessity for much of the mainstream market. This is because semiconductor companies manufacturing designs at ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

Fort Worth, TX. ITC is underway this week, with companies on hand to highlight their software, switching systems, mmWave test cells, test structures, sensors, and power supplies. For example, ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Design-for-test (DFT) is essential to ensure that complex designs can be thoroughly tested. Testing demands continue to increase as designs grow in gate count and fabrication process technologies ...

Applications like as smart cards and devices used in the defense industry require security to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement met ...