Combine AI-generated tests with intelligent test selection to manage large regression suites and speed up feedback ...
A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...
When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that ...
It happens when metrics suggest that a system is well tested, but important behaviours, risks, or failure scenarios remain ...
System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
Compact, modular system with integrated multi-test capability and up to 20-core parallel testing for high-volume efficiency Keysight Technologies, Inc. (NYSE: KEYS) introduces the next generation of ...
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