An astonishingly high level of interest from a wide field of product manufacturers has followed the release of the official Bluetooth specification version 1.0 in July 1999. More IC vendors are ...

Saying that advanced ICs are complex is an understatement. The seemingly endless progression to smaller geometries, the ever-increasing integration between analog and digital blocks, and the ...

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has introduced two new modules that enable its T2000 IPS system to test high-voltage and high-power devices used in the ...

Sigurd Microelectronics, which specializes in wafer probing and final testing of ICs, expects to enjoy growing revenue generated from orders for automotive chips including networking ICs and MCUs in ...

Traditionally, semiconductor manufacturers used Zener- and link-trimming to calibrate parameters such as output voltage on analog ICs. They performed the trimming at the wafer level, using additional ...

Atlantic City, NJ, (September 28, 1999) -- Genesys Testware, Inc. today announced the addition of multi-frequency built-in at-speed testing capability to its Logic BistCore TM product to reduce defect ...

When it comes to testing microelectromechanical system devices and sensors, sometimes you have to shake and bake. and sensors are physically different from standard ICs. They require a specific type ...

Cameron is a self-made geek, Android enthusiast, horror movie fanatic, musician, and cyclist. When he's not pounding keys here at AP, you can find him spending time with his wife and kids, plucking ...

Vijay Sontakke, who works at Intel Corporation as a design engineer, has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing. His ...

BiTS 2016 general chair Ira Feldman welcomed attendees to the BiTS technical sessions this morning, noting that the goal is to focus on what’s current and coming up next with respect to the burn-in ...