EDN

Inspecting the wafer test

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...
EDN

Motorola Claims First Wafer Level Burn-in and Test Process For Flip Chips

Motorola Inc.’s semiconductor products sector (SPS) today said it has developed and qualified the first wafer level burn-in and test (WLBT) process for flip-chip microprocessors. Motorola aims to ...

Rohde & Schwarz Joins FormFactor’s MeasureOne Partner Program, Advancing Their Partnership in On-Wafer RF Component Characterization

(NASDAQ: FORM), a leading provider of RF probe stations and probe cards, and Rohde & Schwarz, a global leader in test and measurement, today announced a strategic co-marketing partnership as part of ...
Nasdaq

Aehr Receives First Order for FOX(TM) Wafer Level Test and Burn-in System to be used for Gallium Nitride Semiconductor Engineering and Qualification

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Semiconductor Engineering

Using Test And Metrology Data For Dynamic Process Control

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...
Seeking Alpha

Aehr Test Systems Announces Wafer Level Burn-in and Test Application Evaluation Order from Leading AI Processor Supplier

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order from a ...
Electronics360

Three big semiconductor test probe challenges

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...
Semiconductor Engineering

Debug And Traceability Of MCMs And Chiplets In The Manufacturing Test Process

Single die packages and products have been the norm for decades. Moreover, so has multi-chip modules (MCMs) or system in package (SiP) for quite some time. Understandably, with ASICs and SoCs becoming ...
FOX8 Cleveland

Silicon Carbide Semiconductor Supplier Selects Aehr FOX System for Wafer Level Test and Burn-in of Silicon Carbide Devices for Automotive Electric Vehicles

FREMONT, CA / ACCESSWIRE / January 25, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor production test and reliability qualification equipment, today announced that a new ...
Silicon Semiconductor

CEA-Leti and Fraunhofer IPMS validate wafer exchange for ferroelectric memory materials

CEA-Leti and Fraunhofer IPMS have successfully completed the first exchange of ferroelectric memory wafers within the FAMES Pilot Line, marking a pivotal milestone in establishing a shared European ...
Benzinga.com

Aehr Test Systems Lands Key Evaluation Order From Leading AI Chip Supplier

Aehr Test Systems (NASDAQ:AEHR) said Tuesday it received an evaluation order from a leading artificial intelligence chip supplier to test its wafer-level burn-in technology. The program will be ...