FormFactor has introduced DC-Boost, an advanced TRE test technology to increase probe test capacity. The new wafer-probe-card capability enables more efficient use of tester channels on test equipment ...

FormFactor has introduced the PH150XP wafer probe card, an extension of the company's PH150 product family for DRAM wafer testing. The PH150XP offers several yield and throughput enhancements to ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...

LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...

Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the ...

As a partner for the semiconductor equipment industry, as well as test providers and users, Jenoptik is offering a novel optical solution for integration into electrical test cards. The ultra-fast ...

Based on FormFactor's scalable MicroSpring interconnect technology, the PH150 probe card enables the testing of 300-mm DRAM wafers in just six touchdowns. The ability to test a wafer in fewer ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

Vertical-Cavity Surface-Emitting Lasers, or VCSELs, are seeing unparalleled demand, thanks to new uses for them in smartphone and automotive applications. 3D sensing for facial recognition is the key ...