The CET is available to gauge a defect when the plaintiff produced evidence of the objective conditions of the product as to which the jury may employ its own sense of whether the product meets ...
This file type includes high resolution graphics and schematics when applicable. In the history of functional verification for complex chips, increasing automation has replaced tedious and expensive ...
LKQ Corp. v. GM Global Technology Operations LLC has brought attention to the ongoing debate surrounding design patent law, particularly with respect to the Rosen-Durling test for design patent ...
In a landmark decision, the US Court of Appeals for the Federal Circuit has overruled the longstanding test for assessing whether a design patent is considered obvious in view of prior art. This ...
The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...
The approach enables DFT and design verification (DV) teams to operate in parallel, accelerating development cycles while improving fault coverage. This cohesive strategy not only boosts test ...
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